| 46 |
from esys.escript.test_util_binary_no_tagged_data import Test_util_binary_no_tagged_data |
from esys.escript.test_util_binary_no_tagged_data import Test_util_binary_no_tagged_data |
| 47 |
from esys.escript.test_util_binary_with_tagged_data import Test_util_binary_with_tagged_data |
from esys.escript.test_util_binary_with_tagged_data import Test_util_binary_with_tagged_data |
| 48 |
from esys.escript.test_util_spatial_functions import Test_Util_SpatialFunctions |
from esys.escript.test_util_spatial_functions import Test_Util_SpatialFunctions |
| 49 |
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from esys.escript.test_util_slicing_no_tagged_data import Test_util_slicing_no_tagged_data |
| 50 |
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from esys.escript.test_util_slicing_with_tagged_data import Test_util_slicing_with_tagged_data |
| 51 |
|
|
| 52 |
class Test_util_reduction(Test_util_reduction_no_tagged_data,Test_util_reduction_with_tagged_data): |
class Test_util_reduction(Test_util_reduction_no_tagged_data,Test_util_reduction_with_tagged_data): |
| 53 |
""" test for reduction operation Lsup,sup,inf for all data types""" |
""" test for reduction operation Lsup,sup,inf for all data types""" |
| 63 |
class Test_util_overloaded_binary(Test_util_overloaded_binary_no_tagged_data,Test_util_overloaded_binary_with_tagged_data): |
class Test_util_overloaded_binary(Test_util_overloaded_binary_no_tagged_data,Test_util_overloaded_binary_with_tagged_data): |
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"""test for all overloaded operation""" |
"""test for all overloaded operation""" |
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pass |
pass |
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class Test_util_with_tagged_data(Test_util_unary_with_tagged_data,Test_util_reduction_with_tagged_data,Test_util_binary_with_tagged_data,Test_util_overloaded_binary_with_tagged_data): |
class Test_util_with_tagged_data(Test_util_unary_with_tagged_data,Test_util_reduction_with_tagged_data,Test_util_binary_with_tagged_data,Test_util_overloaded_binary_with_tagged_data,Test_util_slicing_with_tagged_data): |
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"""test for all operations without tagged data""" |
"""test for all operations without tagged data""" |
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pass |
pass |
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class Test_util_no_tagged_data(Test_util_unary_no_tagged_data,Test_util_reduction_no_tagged_data,Test_util_binary_no_tagged_data,Test_util_overloaded_binary_no_tagged_data): |
class Test_util_no_tagged_data(Test_util_unary_no_tagged_data,Test_util_reduction_no_tagged_data,Test_util_binary_no_tagged_data,Test_util_overloaded_binary_no_tagged_data, Test_util_slicing_no_tagged_data): |
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"""all tests without tagged data""" |
"""all tests without tagged data""" |
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pass |
pass |
| 72 |
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